Taylor Expansion and Matrix-Based Interval Analysis of Linear Arrays With Patch Element Pattern Tolerance

In this study, a novel interval analysis (IA) approach for linear arrays with element pattern tolerance is proposed. This study differentiates itself from the classic (CIA) method because it focuses on effects of array (e.g., patch) antenna pattern; may be caused by fabrication errors in element. The closed-form expressions and are deduced arithmetic method. To mitigate extension (also referred to as overestimation problem) dependency problem, Taylor expansion matrix-based (TMIA) methods proposed implemented study. A set numerical examples reported analyzed indicate effectiveness TMIA results Monte Carlo (MC) CIA methods, well its potential capabilities advantages actual application industrial arrays.